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چکیده
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Abstract: Nowadays manipulation is a very familiar term for researchers and scientists in the field of nanotechnology. The nanoparticulated manipulation process, which is based on Atomic force microscopy, is one of the most important parts of this technology. In the process of manipulation, there are two phases in general. The first phase is used to calculate the critical force and time, which are the most important and fundamental factors of this process. And the second phase involves the displacement of the nanoparticles on the substrate. In this paper, the critical factor of the various contact models using critical force has been investigated. The effect of angle on different contact models such as: DMT،BCP ،COS ،PT and MD Indicates that at the 90 ° angle for all models, the MD contact model has the highest indentation depth. While the COS contact model has the lowest indentation depth. Also, based on the critical force of the three-dimensional manipulation, the COS contact model with 81 Nano Newton has the highest indentation depth of 0.1 nm, but the PT contact model with 200 Nano Newton has a maximum of 0.09 nm of indentation depth.
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