Silver thin films were electrodeposited at various thicknesses and current densities, and their surface morphology was studied with scaling analysis based on atomic force microscopy. The Ag thin films show intrinsic anomalous dynamic scaling that was evaluated with a set of local exponents loc = 0.88 and loc = 0.61, and global ones, = 1.75 and = 1.21. Local slope scales with time as = t0.58. Highorder local roughness exponents decrease with q indicating the existence of multiscaling of the system (and hence anomalous scaling). All the experimental data collapse into one curve of the anomalous dynamic scaling. The results demonstrate that the film deposited with higher current density has higher surface roughness and grain size. Calculation of loc values indicates that they are not dependent on the current density.
